Scanning Probe Microscopy (SPM)

The Scanning Probe Microscope enables high-speed and high-resolution 3D imaging, chemical analysis and mechanical property measurement at the nanoscale. Measurements can be carried out in air and in situ. The probe can be used to manipulate the sample surface at the nanoscale.

What can SPM do?

The suite of instruments at UWA have the ability to analyse the surface topography of a sample, which can be related to the local mechanical or chemical properties using the associated indentation/mechanical testing capabilities or Raman/spectroscopy both in air and in situ.

Why choose us?

CMCA houses multiple advanced SPM instruments, including WITEC Alpha 300RA+ Confocal Raman AFM, Cypher VRS Video-Rate AFM, Keysight 5500 SPM and Hysitron TI 950 Nanoindenter, ensuring optimal resolution for a variety of samples.

Our dedicated SPM team provides expert guidance in experimental design, data acquisition, analysis and interpretation.

Our services

We offer a comprehensive range of services to support your research needs.

  • Sample Preparation: Expert assistance in preparing your samples for optimal imaging and analysis.
  • Data Acquisition: High-quality data collection using advanced SPM techniques.
  • Data Analysis and Interpretation: In-depth analysis and expert interpretation of your results.
  • Consultation and Training: Personalized consultations and hands-on training to help you maximize the capabilities of our facility.

Imaging techniques

Confocal Raman and AFM imaging

Co-localised confocal Raman microscope and AFM to perform both chemical mapping and three-dimensional AFM imaging of a sample. The system can be used for confocal Raman microscopy, confocal optical microscopy and AFM individually or for combined confocal Raman microscopy and AFM (such as Tip-enhanced Raman Spectroscopy (TERS).

Cypher VRS AFM

The Cypher VRS AFM is the first and only full-featured video-rate AFM. It 
allows researchers to obtain high-resolution images and measure dynamic processes in air and in situ down to the nanometer range at video frame rates.

  • Instrument: Cypher VRS AFM

Nanomechanical Testing

Measurement of hardness, elastic modulus and wear resistance at the nanoscale.

Keysight 5500 SPM

The Keysight Scanning Probe Microscope (SPM) is a multi-functional research system for atomic force microscopy (AFM)and scanning tunnelling microscopy (STM), providing atomic scale resolution 3-dimentional imaging of surfaces.

SPMs in various disciplines

Materials Sciences and Critical Minerals

A variety of materials can be identified rapidly with minimal sample preparation using confocal Raman imaging at CMCA. For example, the right figure shows a picture of an ore sample taken by a camera, an optical image, a Raman image and Raman spectra. The green region is rich in spodumene, the blue region is rich in quartz, and the red region is rich in albite.

Nanotechnology/Nanomaterials

The high-resolution video-rate atomic force microscope (AFM) at CMCA enable the direct visualization of the structure and dynamics of materials down to the atomic scale at high speed. Especially as the measurement can be conducted in liquid, it provides profound fundamentals for the development of a wide range of devices that involve solid-liquid interfaces, including advanced metal-ion batteries, super capacitors, and high-performance lubricating systems.

Electronics and device technology

The dependence of the adsorbed structure of an electrolyte solution on an electrode as a function of applied potential can be directly imaged at the atomic scale using the SPM facilities at CMCA. This provides a profound understanding of the interactions of electrolytes with electrodes, and thus enables the rational design of versatile and cost-effective electrolytes for advanced electrical devices, including metal-ion batteries, and supercapacitors.

The SPM has been developed for single molecule break junction measurements, which are very useful in molecular electronics research.

Medical & Biotech

The SPM facilities at CMCA enable the direct visualization of DNA, protein and their complexes in solution down to the nanoscale, which provides a feasible pathway to identify the binding topology of DNA and protein molecules in situ.

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Our instruments

These instruments are available for a wide range of applications.

Platform expert

Dr. Hua Li

SPM Platform Leader, Centre for Microscopy Characterisation and Analysis

Hua received her PhD in Applied Science from the University of South Australia. She has more than 15 years of experience in atomic force microscopy (AFM) and Raman spectroscopy. Her expertise spans high-resolution imaging, interfacial force measurement, along with mechanical property evaluations, including elasticity and hardness

 
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